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Selected Document Category:Published Document
Source:International Electrotechnical Commission
Anticipated Publication Year:
Publication Year:2016
Acronym:IEC
Identifier:IEC TS 62607-6-4
Document Title:Nanomanufacturing - Key control characteristics - Part 6-4: Graphene - Surface conductance measurement using resonant cavity
url:http://webstore.ansi.org/FindStandards.aspx?SearchString=IEC%2fTS+62607-6-4+Ed.+1.0+en%3a2016&SearchOption=0&PageNum=0&SearchTermsArray=null%7cIEC%2fTS+62607-6-4+Ed.+1.0+en%3a2016%7cnullQuestion
Scope:establishes a method for determining the surface conductance of two-dimensional (2D) single-layer or multi-layer atomically thin nano-carbon graphene structures. These are synthesized by chemical vapour deposition (CVD), epitaxial growth on silicon carbide (SiC), obtained from reduced graphene oxide (rGO) or mechanically exfoliated from graphite. The measurements are made in an air filled standard R100 rectangular waveguide configuration, at one of the resonant frequency modes, typically at 7 GHz. Surface conductance measurement by resonant cavity involves monitoring the resonant frequency shift and change in the quality factor before and after insertion of the specimen into the cavity in a quantitative correlation with the specimen surface area. This measurement does not explicitly depend on the thickness of the nano-carbon layer. The thickness of the specimen does not need to be known, but it is assumed that the lateral dimension is uniform over the specimen area.
Keywords:graphene; surface conductance; nano-carbon; chemical vapor deposition; CVD; resonant cavity; resonan
Type of Document:e. Specification
Issues Areas:Measurement and Characterizations
Primary Category:Energy e.g. Energy storage, energy efficiency
Additional Categories
Goal or Need:This document provides a non-contact non-invasive electrical characterization technique for single layer (SL) and and multilayer (ML) graphene films using a microwave resonant cavity without the need for measurement of the graphene layer. It will provide graphene suppliers and customers a reliable and convenient standardized way to determine and verify conductance properties.
Intended Stakeholders:Graphene suppliers, graphene end users; researchers
Is it Being Implemented:
Submitter's Name:Mike Leibowitz
Submitter's e-mail:mike.leibowitz@nema.org
Submitter's Company:NEMA
Additional Comments:
Contact for Additional Info:



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