- | This Technical Specification provides guidance for sample preparation, data acquisition, data processing, and three-dimensional image reconstruction by transmission electron microscopy to measure size and shape parameters of nano-objects on rod-shaped supports. The method applies to samples dispersed on or within an electron-transparent rod-shaped support. |
+ | This document provides guidance for sample preparation, data acquisition by transmission electron microscopy, data processing, and three-dimensional image reconstruction to measure size and shape parameters of nano-objects on rod-shaped supports. The method is applicable to samples dispersed on or within an electron-transparent rod-shaped support. |