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Tracker Item History
View Tracker Item
Version
Field ID
Diff Style
Original
Side-by-side diff
Inline diff
Unified diff
Version
Date
User
Field ID
Field
Difference
1
2014-07-08 14:50
sculley
192
Source (e.g. developer/organization)
-
NIST
-
NCL
+
National Institute of Standards and Technology
-
Nanotechnology Characterization Laboratory
193
Acronym (e.g. ISO, IEC)
-
NIST
+
NIST
-NCL
Links to Relevant Activities
ANSI-NSP
ASTM E56 Committee
BAM NanoScale Reference Materials Database
IEC TC 113 Nanotechnology standardization for electrical and electronic products and systems
ISO TC 229 Nanotechnologies
TAPPI Nanotechnology
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