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Selected Document Category:	Published Document
Source:	International Electrotechnical Commission
Anticipated Publication Year:
Publication Year:	2020
Acronym:	IEC
Identifier:	62607-6-14
Document Title:	Nanomanufacturing - Key control characteristics - Part 6-14: Graphene-based material - Defect level: Raman spectroscopy
url:	https://webstore.ansi.org/Standards/IEC/IECTS6260714Eden2020
Scope:	Establishes a standardized method to determine the structural key control characteristic • defect level for powders consisting of graphene-based material by • Raman spectroscopy.
Keywords:	graphene defect Raman
Type of Document:	e. Specification
Issues Areas:	Measurement and Characterizations
Primary Category:	Energy e.g. Energy storage, energy efficiency
Additional Categories
Goal or Need:
Intended Stakeholders:
Is it Being Implemented:
Submitter's Name:	Mike Leibowitz
Submitter's e-mail:	[email protected]
Submitter's Company:	National Electrical Manufacturers Association
Additional Comments:
Contact for Additional Info:	mike.leibowitz at nema.org

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