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Selected Document Category:	Published Document
Source:	International Organization for Standardization
Anticipated Publication Year:
Publication Year:	2010
Acronym:	ISO
Identifier:	ISO/TS 10867:2010
Document Title:	Nanotechnologies -- Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy
url:	http://webstore.ansi.org/RecordDetail.aspx?sku=ISO%2fTS+10867%3a2010
Scope:	This Technical Specification provides guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy. This Technical Specification provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNT in a sample and their relative integrated PL intensities. The method can be expanded to estimate relative mass concentrations of semi-conducting SWCNTs in a sample from measured integrated PL intensities and knowledge of their PL cross-sections.
Keywords:	single-wall carbon nanotubes; SWCNT, NIR-PL
Type of Document:	a. Standard
Issues Areas:	Measurement and Characterizations
Primary Category:
Additional Categories
Goal or Need:
Intended Stakeholders:
Is it Being Implemented:
Submitter's Name:	Toshi Fujimoto
Submitter's e-mail:	[email protected]
Submitter's Company:	AIST
Additional Comments:
Contact for Additional Info:

Selected Document Category:	Published Document
Source:	International Organization for Standardization
Anticipated Publication Year:
Publication Year:	2010
Acronym:	ISO
Identifier:	ISO/TS 10867:2010
Document Title:	Nanotechnologies -- Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy
url:	http://webstore.ansi.org/RecordDetail.aspx?sku=ISO%2fTS+10867%3a2010
Scope:	This Technical Specification provides guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy. This Technical Specification provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNT in a sample and their relative integrated PL intensities. The method can be expanded to estimate relative mass concentrations of semi-conducting SWCNTs in a sample from measured integrated PL intensities and knowledge of their PL cross-sections.
Keywords:	single-wall carbon nanotubes; SWCNT, NIR-PL
Type of Document:	a. Standard
Issues Areas:	Measurement and Characterizations
Primary Category:
Additional Categories
Goal or Need:
Intended Stakeholders:
Is it Being Implemented:
Submitter's Name:	Toshi Fujimoto
Submitter's e-mail:	[email protected]
Submitter's Company:	AIST
Additional Comments:
Contact for Additional Info:

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