Selected Document Category: | Published Document |
Source: | International Organization for Standardization |
Anticipated Publication Year: | |
Publication Year: | 2010 |
Acronym: | ISO |
Identifier: | ISO/TS 10867:2010 |
Document Title: | Nanotechnologies -- Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy |
url: | http://webstore.ansi.org/RecordDetail.aspx?sku=ISO%2fTS+10867%3a2010 |
Scope: | This Technical Specification provides guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy. This Technical Specification provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNT in a sample and their relative integrated PL intensities. The method can be expanded to estimate relative mass concentrations of semi-conducting SWCNTs in a sample from measured integrated PL intensities and knowledge of their PL cross-sections. |
Keywords: | single-wall carbon nanotubes; SWCNT, NIR-PL |
Type of Document: | a. Standard |
Issues Areas: | Measurement and Characterizations |
Primary Category: | |
Additional Categories | |
Goal or Need: | |
Intended Stakeholders: | |
Is it Being Implemented: | |
Submitter's Name: | Toshi Fujimoto |
Submitter's e-mail: | [email protected] |
Submitter's Company: | AIST |
Additional Comments: | |
Contact for Additional Info: |