Selected Document Category: | Published Document
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Source: | ASTM International Technical Committee E56
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Anticipated Publication Year: |
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Publication Year: | 2012
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Acronym: |
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Identifier: | E2834
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Document Title: | Standard Guide for Measurement of Particle Size Distribution of Nanomaterials in Suspension by Nanoparticle Tracking Analysis (NTA)
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url: | http://compass.astm.org/EDIT/html_annot.cgi?E2834+12
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Scope: | This guide deals with the measurement of particle size distribution of suspended particles, from ~10 nm to the onset of sedimentation, sample dependent, using the nanoparticle tracking analysis (NTA) technique. It does not provide a complete measurement methodology for any specific nanomaterial, but provides a general overview and guide as to the methodology that should be followed for good practice, along with potential pitfalls.
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Keywords: | dynamic light scattering; nano; nanoparticle tracking analysis; photon correlation spectroscopy
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Type of Document: | a. Standard
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Issues Areas: | Measurement and Characterizations
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Primary Category: |
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Additional Categories |
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Goal or Need: | NTA is one of the very few techniques that are able to deal with the measurement of particle size distribution in the nano-size region. This Guide describes the NTA technique for direct visualization and measurement of Brownian motion, generally applicable in the particle size range from several nanometers until the onset of sedimentation in the sample. The technique is routinely applied in industry and academia as both a research and development tool and as a QC method for the characterization of submicron systems.
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Intended Stakeholders: | Researchers, developers, manufacturers and users of nanomaterials and nanotechnology-enabled products. Stakeholders from industry, government agencies, including regulatory agencies, and academia.
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Is it Being Implemented: |
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Submitter's Name: | Debra Kaiser
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Submitter's e-mail: | [email protected]
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Submitter's Company: | NIST
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Additional Comments: |
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Contact for Additional Info: | Duncan Griffiths; duncan.griffiths at nanosight.com |