Selected Document Category: | Published Document |
Source: | International Organization for Standardization |
Anticipated Publication Year: | 2015 |
Publication Year: | 2016 |
Acronym: | ISO |
Identifier: | 18196 |
Document Title: | Measurement technique matrix for the characterization of nano-objects |
url: | http://webstore.ansi.org/RecordDetail.aspx?sku=ISO%2fTR+18196%3a2016 |
Scope: | This Technical Report provides a matrix, which guides users to commercially available techniques relevant to the measurements of common physicochemical parameters for nano-objects. Some techniques are also applicable to nanostructured materials. |
Keywords: | nano-objects, physico-chemical characterization, TEM, SEM, SFM, SPM, FT-IR, DLS, EELS, IG, ICP-MS, |
Type of Document: | a. Standard |
Issues Areas: | Measurement and Characterizations |
Primary Category: | |
Additional Categories | |
Goal or Need: | This Technical Report connects the nano-object parameters that most commonly need to be measured with
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Intended Stakeholders: | |
Is it Being Implemented: | |
Submitter's Name: | Heather Benko |
Submitter's e-mail: | [email protected] |
Submitter's Company: | American National Standards Institute |
Additional Comments: | |
Contact for Additional Info: | Toshiyuki Fujimoto, T.Fujimoto at aist.go.jp |