134

Selected Document Category:	Published Document
Source:	International Organization for Standardization
Anticipated Publication Year:	2015
Publication Year:	2016
Acronym:	ISO
Identifier:	18196
Document Title:	Measurement technique matrix for the characterization of nano-objects
url:	http://webstore.ansi.org/RecordDetail.aspx?sku=ISO%2fTR+18196%3a2016
Scope:	This Technical Report provides a matrix, which guides users to commercially available techniques relevant to the measurements of common physicochemical parameters for nano-objects. Some techniques are also applicable to nanostructured materials.
Keywords:	nano-objects, physico-chemical characterization, TEM, SEM, SFM, SPM, FT-IR, DLS, EELS, IG, ICP-MS,
Type of Document:	a. Standard
Issues Areas:	Measurement and Characterizations
Primary Category:
Additional Categories
Goal or Need:	This Technical Report connects the nano-object parameters that most commonly need to be measured with corresponding measurement techniques. This Technical Report will be an invaluable tool for nanotechnology scientists to rapidly identify relevant information for measuring nano-objects
Intended Stakeholders:
Is it Being Implemented:
Submitter's Name:	Heather Benko
Submitter's e-mail:	[email protected]
Submitter's Company:	American National Standards Institute
Additional Comments:
Contact for Additional Info:	Toshiyuki Fujimoto, T.Fujimoto at aist.go.jp

Selected Document Category:	Published Document
Source:	International Organization for Standardization
Anticipated Publication Year:	2015
Publication Year:	2016
Acronym:	ISO
Identifier:	18196
Document Title:	Measurement technique matrix for the characterization of nano-objects
url:	http://webstore.ansi.org/RecordDetail.aspx?sku=ISO%2fTR+18196%3a2016
Scope:	This Technical Report provides a matrix, which guides users to commercially available techniques relevant to the measurements of common physicochemical parameters for nano-objects. Some techniques are also applicable to nanostructured materials.
Keywords:	nano-objects, physico-chemical characterization, TEM, SEM, SFM, SPM, FT-IR, DLS, EELS, IG, ICP-MS,
Type of Document:	a. Standard
Issues Areas:	Measurement and Characterizations
Primary Category:
Additional Categories
Goal or Need:	This Technical Report connects the nano-object parameters that most commonly need to be measured with corresponding measurement techniques. This Technical Report will be an invaluable tool for nanotechnology scientists to rapidly identify relevant information for measuring nano-objects
Intended Stakeholders:
Is it Being Implemented:
Submitter's Name:	Heather Benko
Submitter's e-mail:	[email protected]
Submitter's Company:	American National Standards Institute
Additional Comments:
Contact for Additional Info:	Toshiyuki Fujimoto, T.Fujimoto at aist.go.jp

::::