Selected Document Category: | Published Document
|
Source: | International Electrotechnical Commission
|
Anticipated Publication Year: |
|
Publication Year: | 2020
|
Acronym: | IEC
|
Identifier: | 62607-5-3
|
Document Title: | Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration
|
url: | https://webstore.ansi.org/Standards/IEC/IECTS62607Eden2020-2407599
|
Scope: | Specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials, provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration.
|
Keywords: | van der Pauw; carrier concentration
|
Type of Document: | e. Specification
|
Issues Areas: | Measurement and Characterizations
|
Primary Category: | Energy e.g. Energy storage, energy efficiency
|
Additional Categories |
|
Goal or Need: |
|
Intended Stakeholders: |
|
Is it Being Implemented: |
|
Submitter's Name: | Mike Leibowitz
|
Submitter's e-mail: | [email protected]
|
Submitter's Company: | National Electrical Manufacturers Association
|
Additional Comments: |
|
Contact for Additional Info: | mike.leibowitz at nema.org |