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Selected Document Category:Published Document
Source:International Electrotechnical Commission
Anticipated Publication Year:
Publication Year:2020
Document Title:Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration
Scope:Specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials, provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration.
Keywords:van der Pauw; carrier concentration
Type of Document:e. Specification
Issues Areas:Measurement and Characterizations
Primary Category:Energy e.g. Energy storage, energy efficiency
Additional Categories
Goal or Need:
Intended Stakeholders:
Is it Being Implemented:
Submitter's Name:Mike Leibowitz
Submitter's e-mail:[email protected]
Submitter's Company:National Electrical Manufacturers Association
Additional Comments:
Contact for Additional Info:mike.leibowitz at nema.org