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Selected Document Category:Published Document
Source:International Electrotechnical Commission
Anticipated Publication Year:
Publication Year:2020
Acronym:IEC
Identifier:62607-8-1
Document Title:Nanomanufacturing - Key control characteristics - Part 8-1: Nano-enabled metal-oxide interfacial devices - Test method for defect states by thermally stimulated current
url:https://webstore.ansi.org/Standards/IEC/IECTS62607Eden2020-2407371
Scope:There are two types of thermally stimulated current (TSC) measurement methods, classified by the origin of the current. One is generated by the detrapping of charges. The other one is generated by depolarization. IEC TS 62607-8-1:2020 focuses on the former method, and specifies the measurement method to be developed for determining defect states of nano-enabled metal-oxide interfacial devices.
Keywords:
Type of Document:e. Specification
Issues Areas:Measurement and Characterizations
Primary Category:Energy e.g. Energy storage, energy efficiency
Additional Categories
Goal or Need:
Intended Stakeholders:
Is it Being Implemented:
Submitter's Name:Mike Leibowitz
Submitter's e-mail:[email protected]
Submitter's Company:National Electrical Manufacturers Association
Additional Comments:
Contact for Additional Info:mike.leibowitz at nema.org



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