Selected Document Category: | Published Document
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Source: | International Electrotechnical Commission
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Anticipated Publication Year: |
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Publication Year: | 2020
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Acronym: | IEC
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Identifier: | 62607-8-1
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Document Title: | Nanomanufacturing - Key control characteristics - Part 8-1: Nano-enabled metal-oxide interfacial devices - Test method for defect states by thermally stimulated current
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url: | https://webstore.ansi.org/Standards/IEC/IECTS62607Eden2020-2407371
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Scope: | There are two types of thermally stimulated current (TSC) measurement methods, classified by the origin of the current. One is generated by the detrapping of charges. The other one is generated by depolarization. IEC TS 62607-8-1:2020 focuses on the former method, and specifies the measurement method to be developed for determining defect states of nano-enabled metal-oxide interfacial devices.
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Keywords: |
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Type of Document: | e. Specification
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Issues Areas: | Measurement and Characterizations
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Primary Category: | Energy e.g. Energy storage, energy efficiency
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Additional Categories |
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Goal or Need: |
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Intended Stakeholders: |
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Is it Being Implemented: |
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Submitter's Name: | Mike Leibowitz
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Submitter's e-mail: | [email protected]
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Submitter's Company: | National Electrical Manufacturers Association
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Additional Comments: |
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Contact for Additional Info: | mike.leibowitz at nema.org |