Selected Document Category: | Document Awaiting to be Published |
Source: | International Electrotechnical Commission |
Anticipated Publication Year: | 2015 |
Publication Year: | |
Acronym: | IEC |
Identifier: | IEC 62659 |
Document Title: | Large scale manufacturing for nanoelectronics |
url: | http://www.iec.ch/dyn/www/f?p=103:38:0::::FSP_ORG_ID,FSP_APEX_PAGE,FSP_LANG_ID,FSP_PROJECT:1315,23,25,IEC/IEEE%2062659%20Ed.%201.0 |
Scope: | This standard provides a framework for introducing nanoelectronics into large scale, high volume production in semiconductor manufacturing facilities through the incorporation of nanomaterials (e.g. CNT, graphene, quantum dots, etc.) (fabs). Since semiconductor fabs must incorporate practices that maintain high yields, there are very strict requirements for how manufacturing is performed. Nanomaterials represent a potential contaminant in semiconductor fabs, and must be introduced in a structured and methodical way.
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Keywords: | nanoscale; contacts; nanomanufacturing; graphene; carbon nanotubes; nanotechnology; process; bottom- |
Type of Document: | a. Standard |
Issues Areas: | Terminology and Nomenclature Measurement and Characterizations Material Specifications Performance Methods Product Specifications |
Primary Category: | General Industry/Manufacturing |
Additional Categories | |
Goal or Need: | |
Intended Stakeholders: | |
Is it Being Implemented: | |
Submitter's Name: | Mike Leibowitz |
Submitter's e-mail: | [email protected] |
Submitter's Company: | NEMA |
Additional Comments: | |
Contact for Additional Info: | mike.leibowitz at nema.org |