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Selected Document Category:Published Document
Source:International Organization for Standardization
Anticipated Publication Year:
Publication Year:2010
Acronym:ISO
Identifier:ISO/TS 11251-2010
Document Title:Nanotechnologies – Characterization of volatile components in single-wall carbon nanotube samples using evolved gas analysis/gas chromatograph-mass spectrometry
url:http://webstore.ansi.org/RecordDetail.aspx?sku=ISO%2fTS+11251%3a2010
Scope:This Technical Specification specifies a method for the characterization of volatile components in single-wall carbon nanotubes (SWCNTs) samples using evolved gas analysis/gas chromatograph mass spectrometry (EGA/GCMS).
Keywords:single-wall carbon nanotubes; SWCNT, EGA-GCMS
Type of Document:a. Standard
Issues Areas:Measurement and Characterizations
Primary Category:
Additional Categories
Goal or Need:
Intended Stakeholders:
Is it Being Implemented:
Submitter's Name:Toshi Fujimoto
Submitter's e-mail:[email protected]
Submitter's Company:AIST
Additional Comments:
Contact for Additional Info:
Selected Document Category:Published Document
Source:International Organization for Standardization
Anticipated Publication Year:
Publication Year:2010
Acronym:ISO
Identifier:ISO/TS 11251-2010
Document Title:Nanotechnologies – Characterization of volatile components in single-wall carbon nanotube samples using evolved gas analysis/gas chromatograph-mass spectrometry
url:http://webstore.ansi.org/RecordDetail.aspx?sku=ISO%2fTS+11251%3a2010
Scope:This Technical Specification specifies a method for the characterization of volatile components in single-wall carbon nanotubes (SWCNTs) samples using evolved gas analysis/gas chromatograph mass spectrometry (EGA/GCMS).
Keywords:single-wall carbon nanotubes; SWCNT, EGA-GCMS
Type of Document:a. Standard
Issues Areas:Measurement and Characterizations
Primary Category:
Additional Categories
Goal or Need:
Intended Stakeholders:
Is it Being Implemented:
Submitter's Name:Toshi Fujimoto
Submitter's e-mail:[email protected]
Submitter's Company:AIST
Additional Comments:
Contact for Additional Info:



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