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Selected Document Category:	Published Document
Source:	International Electrotechnical Commission
Anticipated Publication Year:
Publication Year:	2009
Acronym:	IEC/IEEE
Identifier:	IEC 62624
Document Title:	Test methods for measurement of electrical properties of carbon nanotubes
url:	http://webstore.ansi.org/RecordDetail.aspx?sku=IEC+62624+Ed.+1.0+en%3a2009
Scope:	Provides methods for the electrical characterization of carbon nanotubes (CNTs), independent of processing routes used to fabricate the CNTs
Keywords:	carbon nanotube; electrical characterization; high-impedance measurement; nanotechnology
Type of Document:	a. Standard
Issues Areas:	Measurement and Characterizations
Primary Category:	Computers and electronics
Additional Categories
Goal or Need:	To assist in the diffusion of CNT technology from laboratory to marketplace. The standardized characterization methods and reporting practices therein create a means of effective comparison of information and a foundation for manufacturing readiness.The standard will also minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring CNTs, and minimize confusion in analyzing reported data through standard reporting practices.
Intended Stakeholders:	CNT suppliers; electronics and computer manufacturing
Is it Being Implemented:
Submitter's Name:	Mike Leibowitz
Submitter's e-mail:	[email protected]
Submitter's Company:	NEMA
Additional Comments:
Contact for Additional Info:

Selected Document Category:	Published Document
Source:	International Electrotechnical Commission
Anticipated Publication Year:
Publication Year:	2009
Acronym:	IEC/IEEE
Identifier:	IEC 62624
Document Title:	Test methods for measurement of electrical properties of carbon nanotubes
url:	http://webstore.ansi.org/RecordDetail.aspx?sku=IEC+62624+Ed.+1.0+en%3a2009
Scope:	Provides methods for the electrical characterization of carbon nanotubes (CNTs), independent of processing routes used to fabricate the CNTs
Keywords:	carbon nanotube; electrical characterization; high-impedance measurement; nanotechnology
Type of Document:	a. Standard
Issues Areas:	Measurement and Characterizations
Primary Category:	Computers and electronics
Additional Categories
Goal or Need:	To assist in the diffusion of CNT technology from laboratory to marketplace. The standardized characterization methods and reporting practices therein create a means of effective comparison of information and a foundation for manufacturing readiness.The standard will also minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring CNTs, and minimize confusion in analyzing reported data through standard reporting practices.
Intended Stakeholders:	CNT suppliers; electronics and computer manufacturing
Is it Being Implemented:
Submitter's Name:	Mike Leibowitz
Submitter's e-mail:	[email protected]
Submitter's Company:	NEMA
Additional Comments:
Contact for Additional Info:

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