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Selected Document Category:Published Document
Source:International Electrotechnical Commission
Anticipated Publication Year:
Publication Year:2013
Acronym:IEC
Identifier:IEC 62860
Document Title:Test methods for the characterization of organic transistors and materials
url:http://webstore.ansi.org/RecordDetail.aspx?sku=IEC+62860+Ed.+1.0+en%3a2013
Scope:covers recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors Due to the nature of printed and organic electronics significant measurement errors can be introduced if the electrical characterization design of experiment is not properly addressed This standard describes the most common sources of measurement error particularly for high impedance electrical measurements commonly required for printed and organic transistors This standard also gives recommended practices in order to minimize and or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors.
Keywords:electrical characterization FET flexible electronics high impedance nanocomposite nanotechnology OFE
Type of Document:a. Standard
Issues Areas:Measurement and Characterizations
Primary Category:Computers and electronics
Additional Categories
Goal or Need:

To provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework
for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices.

Intended Stakeholders:
Is it Being Implemented:
Submitter's Name:Mike Leibowitz
Submitter's e-mail:[email protected]
Submitter's Company:NEMA
Additional Comments:
Contact for Additional Info:



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