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Selected Document Category:Published Document
Source:International Electrotechnical Commission
Anticipated Publication Year:
Publication Year:2013
Acronym:IEC
Identifier:IEC 62860-1
Document Title:Test methods for the characterization of organic transistor-based ring oscillators
url:http://webstore.ansi.org/RecordDetail.aspx?sku=IEC+62860-1+Ed.+1.0+en%3a2013
Scope:covers recommended methods and standardized reporting practices for electrical characterization of printed and organic ring oscillators Due to the nature of printed and organic circuits significant measurement errors can be introduced if the electrical characterization design of experiment is not properly addressed This standard describes the most common sources of measurement error particularly for high impedance electrical measurements commonly required for printed and organic ring oscillators This standard also gives recommended practices in order to minimize and or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring oscillators
Keywords:electrical characterization; high impedance; printing; organic transistor; printed electronics; ring
Type of Document:a. Standard
Issues Areas:Measurement and Characterizations
Primary Category:Computers and electronics
Additional Categories
Goal or Need:
Intended Stakeholders:
Is it Being Implemented:
Submitter's Name:Mike Leibowitz
Submitter's e-mail:[email protected]
Submitter's Company:NEMA
Additional Comments:
Contact for Additional Info:



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